Technische Ausstattung

Our claylab houses a series of high resolution tools for studying the crystal-chemistry of fine-grained materials. Our prime techniques involve combining X-ray diffraction, and electron microscopy (scanning and transmission modes) for characterizing and monitoring fine particle mineral reactions in various geological and geotechnical settings. A summary of our analytical instruments is listed as follows:

 

Röntgendiffraktometrie (XRD)

Bruker D8 Advance

- Humidity chamber
- High temperature reaction chamber
- Wet-cell XRD cells

Bruker D5000 X-ray diffractometer
 
- 40facher Probenwechsler
- Cu-Röntgenröhre

 

 

 

 

Elektronenmikroskopie (TEM | SEM | FIB-SEM | REM)

Jeol Jem 1210
High resolution transmission electron microscope (TEM)
 
- Oxford instruments EDX (30mm2 SiLi detector)
- Selective electron diffraction analyses
- Gatan CCD camera system

Zeiss-Evo MA 10
Rasterelektronenmikroskop mit Energiedispersiver Röntgenspektroskopie (REM-EDX)
 
- Wolframfilament
- 3 nm Auflösung bei 30 kV
- Variabler Druckbereich (10 - 400 Pa)
- Sekundärelektronenselektor (SE)
- Rückstreuelektronendetetor (BSD)
- EDX-Detektor: EDAX Element
- bis 30 kV Beschleunigungsspannung

Zeiss Auriga Crossbeam microscope
Focused ion beam - electron microscopy (FIB-SEM)
 
- Cryostat
- Manipulator
- Secondary electron detector
- ESB backscatter electron detector
- EBSD Oxford instruments detector
- INCA EDX analyses (with 80mm2 Oxford instruments detector)

 

Thermisch- und chemische Analysesysteme (TG-DTA | RFA)

SETARAM TGA 92 (TG, DTA, DSC)
Differential thermal analyses
 
- upto 1600 °C
- air and inert gas

 

 

 

 

 

 

 

Präparation

Eppendorf Zentrifuge 5810 R

Heraeus Durchfluss-Zentrifuge 17RS